EN 60749-6 EUROPEANSTANDARD NORMEEUROPEENNE EUROPAISCHENORM June 2017 ICS31.080.01 Supersedes EN 60749-6:2002 English Version Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature (IEC60749-6:2017) Dispositifs a semiconducteurs - Methodes d'essais Halbleiterbauelemente - Mechanische und klimatische mecaniques et climatiques - Partie 6: Stockage a haute Prufverfahren - Teil 6: Lagerung bei hoher Temperatur temperature (IEC 60749-6:2017) (IEC 60749-6:2017) This European Standard was approved by CENELEC on 2017-04-07. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comite Europeen de Normalisation Electrotechnique Europaisches Komitee fir Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix17, B-1000 Brussels Ref. No. EN 60749-6:2017 E EN60749-6:2017 The text of document 47/2347/FDIS, future edition 2 of IEC 60749-6, prepared by IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by CENELECasEN60749-6:2017. The following dates are fixed: latest date by which the document has to be implemented at (dop) 2018-01-07 national level by publication of an identical national standardorbyendorsement latest date by which the national standards conflicting with (dow) 2020-04-07 the document have to be withdrawn This document supersedes EN 60749-6:2002 patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights The text of the International Standard IEC 60749-6:2017 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC60749-20 NOTE Harmonized as EN 60749-20. IEC 60749-43 NOTE Harmonized as EN 60749-43 1). 1)At draft stage. 2 IEC60749-6:2017@IEC2017 - 2 - FOREWORD 3 Scope 1 .5 2 Normativereferences 3 Terms and definitions .5 4 Test apparatus 5 5 Procedure. ..5 5.1 Test conditions .5 5.2 Measurements 5.3 Failure crieria.. 9 Summary. Bibliography.. .8 Table 1-High temperature storage conditions 6
IEC 60749-6 2017 Semiconductor devices - Mechanical and climatic test methods - Part 6 Storage at high temperature
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